XRF Sensitivity Improvement with a Novel Capacitive Concentration Cell
نویسندگان
چکیده
A method for concentrating dissolved ions is presented which, in combination with current x-ray fluorescence methods, can yield limits of detection in the low to mid part-per-billion range. This method relies upon the fundamental principles of capacitive deionization, where an electrical double-layer capacitor is used to temporarily capture dissolved ions in a semi-selective manner. The efficiency and capacity of an electrical double-layer capacitor is maximized by using a material with extremely high surface area and nano-scale pores: mesoporous carbon aerogel. This is used in conjunction with a novel x-ray fluorescence instrument to provide automated analysis of the metal content in sample liquids down to low part-per-billion levels without the need for consumables or technicians. Element-specific concentration methods are not required; using a generic method the limit of detection for chromium was determined to be 23 part-perbillion.
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